| |
Title |
Speaker |
Affiliation |
| 13:00 |
Opening remarks, tech check |
A. Žukauskaitė |
Fraunhofer FEP |
| |
Session 1 |
Session Chair A. Žukauskaitė |
|
| 13:05 |
Magnetron Sputter Epitaxy for High Volume Manufacturing |
Dr. Thomas Tschirky |
Evatec AG (Switzerland) |
| 13:45 |
Nanoscopic insights into epitaxial III- nitride thin films |
Dr. Niklas Wolff |
Kiel University CAU (Germany) |
| 14:05 |
III-Nitride Magnetron Sputter Epitaxy on 200mm substrates for power device applications |
Dr. Valentin Garbe*, M. Ott, B. Haude, A. Žukauskaitė, J. Neidhardt, E. von Hauff |
* Fraunhofer Institute for Electron Beam and Plasma Technology FEP (Germany) |
| 14:25 |
Integrating AlN and heteroepitaxial diamond |
Dr. Jürgen Weippert*, L. Kirste, V. Lebedev, Ch. Manz, S Müller, M. Prescher, S. Leone, M. Raghuwanshi, B. Sundarapandian, T. Fehrenbach, M. Ohnemus, Ch. Wild |
* Fraunhofer Institute for Applied Solid State Physics IAF, (Germany), Silicon Austrial Labs GmbH (Austria), Diamond Materials GmbH (Germany) |
| 14:45 |
Coffee Break |
|
|
| |
Session 2 |
Session Chair V. Garbe |
|
| 15:00 |
Utilizing gas rarefaction to optimize preferential metal ion acceleration for epitaxial AlN growth on silicon |
Behravan Nastaran*, A. Farhadizadeh, T. Pitonakova, T. Terzic, D. Solonenko, D. Lundin |
* Silicon Austria Labs GmbH (Austria), * Linköping University (Sweden), Masaryk University (Czech Republic), Otto von Guericke University Magdeburg OvGU (Germany) |
| 15:20 |
How to reduce optical loss in AlN thin films using magnetron sputter epitaxy? |
Dr. Mohit Raghuwanshi*, B Sundarapandian, L Kirste, P. Strănák, M. Prescher, R. Singh, R. Thomas, S. Suckow, and M. Lemme |
* Fraunhofer Institute for Applied Solid State Physics IAF (Germany), AMO GmbH (Germany) |
| 15:40 |
In-situ growth monitoring of AlN and GaN in sputter epitaxy |
Dr. Florian Hörich, R. Borgmann, J. Bläsing, G. Schmidt, P. Veit, F. Bertram, J. Christen, A. Strittmatter, A. Dadgar |
Otto von Guericke University Magdeburg OvGU (Germany) |
| 16:00 |
Reactive High-Temperature Annealing of Sputtered AlN on Sapphire under Nitrogen, Ammonia and Carbon Monoxide Atmospheres |
Karl Kreuzer |
Nitride Technology Center NTC, Institute of Semiconductor Technology, TU Braunschweig (Germany) |
| 16:20 |
Magnetron Sputter Epitaxy of AlN and GaN: progress in scaling and crystalline quality |
Morris Ott*, B. Haude, Z. Wei, K. Kreuzer, C. Margenfeld, P. Stranak, M. Hinterstein, K. Pingen, A. Hinz, A. Žukauskaitė, J. Neidhardt, E. v. Hauff, V. Garbe |
* Fraunhofer Institute for Electron Beam and Plasma Technology FEP (Germany), TU Dresden (Germany) |
| 16:40 |
Sputter Beam Epitaxy method for low energy thin film deposition |
Dr. Adam Hauser |
University of Alabama (USA) |
| 17:00 |
Closing, Day 1 |
Session Chairs |
Fraunhofer FEP |